The article introduces two new statistics for testing how well data fits a specific distribution. The first statistic, Sn, is more powerful than the commonly used Kolmogorov-Smirnov test. The second statistic, S*n, is better at testing fit to an exponential distribution with an unknown mean. Critical values for these statistics are provided for different sample sizes and significance levels. These new statistics are similar to the Kolmogorov-Smirnov test but offer improved performance in certain cases.