Earth and Planetary Sciences
8 years ago

New photogrammetry model eliminates errors, ensuring accurate results every time!

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Utilizing semi-parametric model to compensate systematic errors in photogrammetry
Huiping Zhu, Li Yan, Fei Deng

Paper Summary

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The article discusses how using a Semi-parametric model can help correct errors in photogrammetry data processing caused by uncertainties in observations. By combining parametric and non-parametric components, this model can better handle uncertainties and produce more accurate results compared to traditional parametric models. Testing shows that the Semi-parametric model effectively reduces errors caused by observation uncertainties.