Leaf nitrogen accumulation in wheat can be monitored using hyper-spectral remote sensing. By analyzing canopy reflectance spectra, researchers found that certain bands of light were sensitive to changes in leaf nitrogen levels. They identified specific vegetation indicators that were highly correlated with leaf nitrogen accumulation, such as FD742 and REPIG. These indicators can accurately predict leaf nitrogen levels in wheat, with FD742 performing better in modeling and testing. This method allows for non-destructive and rapid assessment of leaf nitrogen, which is crucial for improving nitrogen management in wheat production.