New technology accurately measures sub-micron powder, revolutionizing industrial production.
Researchers measured the particle size distribution of sub-micron CeO2 powder in a concentrated suspension using dynamic light scattering and laser diffraction. They found that the results from laser diffraction showed larger particle sizes compared to dynamic light scattering. The dispersing pre-treatment affected the dynamic light scattering results to some extent. The particle size distribution results on the number base from dynamic light scattering matched well with results from TEM analysis. The new dynamic light scattering method can accurately measure the particle size distribution of sub-micron CeO2 powder in properly dispersed high concentration suspensions.