Increasing wheat yield in the Huang-Huai Plain can be achieved by improving post-anthesis productivity to increase the harvest index. By studying different cultivation patterns and water-nitrogen modes, researchers found that increasing the net accumulation of dry matter during filling helps maintain a high harvest index, leading to higher yields. Higher leaf area potential and radiation interception potential during grain filling contribute to increased dry matter accumulation after anthesis. Maintaining higher leaf area index and radiation interception in lower layers during grain formation also boosts yield. Optimal pre-anthesis translocation amounts and contribution ratios are crucial for achieving high yields. These findings emphasize the importance of harvest index in enhancing wheat production in the Huang-Huai Plain.