Mathematics
5 years ago

New Algorithm Speeds Up Reliability Testing for Safer Products

IEEE Transactions on Reliability
Parameter Estimation Using EM Algorithm For Lifetimes From Step-Stress and Constant-Stress Accelerated Life Tests With Interval Monitoring
David Han, Tianyu Bai

Paper Summary

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Accelerated life tests can quickly give us reliability info by testing at high stress levels. A new method using the EM algorithm estimates regression parameters for failure data from these tests. The method is shown to work well and is easy to use. The study also calculates the variances and covariances of the estimates. This approach was tested on a real engineering case.