Environmental Science
a year ago

New technology combines optical and microwave data to accurately measure crop growth.

National Remote Sensing Bulletin
Retrieving crop leaf area index by combining optical and microwave vegetation indices: A feasibility analysis
Hejuan Du, Qinhuo Liu, Li Jing, Le Yang

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Scientists have found a way to accurately measure the leaf area of corn plants using a combination of optical and microwave data. By analyzing the reflectance and scattering properties of vegetation, they developed models that can estimate changes in leaf area with high precision. The optical index MNDVI is sensitive to leaf area changes from 0 to 3, while the microwave index SAR SRVI is sensitive to changes from 3 to 6. This study shows that using both types of data can effectively track the growth of corn plants.