Accelerated life testing reveals faster parameter estimation for improved product reliability.
The article explores how to estimate parameters for a two-parameter exponential distribution in accelerated life testing with three step-stress levels. By using a log-quadratic function of stress and a tempered failure rate model, the researchers found the maximum likelihood estimators for the model parameters and their confidence regions. The study aims to provide a practical way to quickly gather information about the lifetimes of test units under high stress conditions.