Mathematics
8 years ago

New method identifies outliers in data, improving accuracy of logistic regression.

Communications for Statistical Applications and Methods
V-mask Type Criterion for Identification of Outliers In Logistic Regression
Bu-Yong Kim

Paper Summary

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The article introduces a method to find outliers in logistic regression. It uses a technique called hierarchical clustering to identify unusual data points, and then uses a V-mask criterion to classify them into different categories. The method was tested on various data sets and was found to effectively handle situations where outliers can hide or overwhelm the analysis.